Rupasinghe, Thilini P2025-02-172025-02-172019-01https://dr.ichemc.ac.lk/handle/123456789/234Page 7-9 Guest ArticlesAtomic Force Microscopy (AFM), without any doubt can be named as one of the most sensitive imaging techniques which allows researchers to explore a broad spectrum of materials such as semiconductors, nanocrystals, biological materials, pharmaceuticals, polymers etc. AFM was first invented in 1986 by Gerd Binnig, Calvin Quate and Christoph Gerber to overcome the limitations of its ancestor, scanning tunnelling microscopy (STM).enAtomic Force MicroscopyMechanical Characterization of NanomaterialsNATURAL SCIENCES::BiologyArticle