Atomic Force Microscopy: Is It Just an Imaging Technique?

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dc.contributor.authorRupasinghe, Thilini P
dc.date.accessioned2025-02-17T10:08:41Z
dc.date.available2025-02-17T10:08:41Z
dc.date.issued2019-01
dc.descriptionPage 7-9 Guest Articles
dc.description.abstractAtomic Force Microscopy (AFM), without any doubt can be named as one of the most sensitive imaging techniques which allows researchers to explore a broad spectrum of materials such as semiconductors, nanocrystals, biological materials, pharmaceuticals, polymers etc. AFM was first invented in 1986 by Gerd Binnig, Calvin Quate and Christoph Gerber to overcome the limitations of its ancestor, scanning tunnelling microscopy (STM).
dc.identifier.urihttps://dr.ichemc.ac.lk/handle/123456789/234
dc.language.isoen
dc.publisherInstitute of Chemistry Ceylon
dc.relation.ispartofseries36; 01
dc.subjectAtomic Force Microscopy
dc.subjectMechanical Characterization of Nanomaterials
dc.subjectNATURAL SCIENCES::Biology
dc.titleAtomic Force Microscopy: Is It Just an Imaging Technique?
dc.typeArticle

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