Atomic Force Microscopy: Is It Just an Imaging Technique?

Abstract

Atomic Force Microscopy (AFM), without any doubt can be named as one of the most sensitive imaging techniques which allows researchers to explore a broad spectrum of materials such as semiconductors, nanocrystals, biological materials, pharmaceuticals, polymers etc.1 In recent years, AFM has demonstrated the ability of generating images with resolutions high enough to visualize sample features measured in fractions of nanometers or “atomic resolution”. AFM uniquely offers unprecedented spatial resolution imaging owing to its high force sensing capability and nanometer scale position accuracy.